AOI-LD420 model is a high-precision microscopic inspection system developed for visual inspection of laser chip. It is applied in defect inspection of the chip manufacturing process, improving the stability of the manufacturing process quality. This system is based on a precision motion system and vibration isolation platform, equipped with a nanometer-level optical positioning feedback system. The core vision system combines traditional algorithms with AI algorithms to improve process capabilities in the inspections of the AR surface, HR surface, P surface, and N surface. It can also identify chip serial number and output corresponding defect information.

• Easy to Operate: Fast modeling, with automatic template generation for similar products
  

• Defect Detection Powered by Deep Learning + Traditional Algorithms: Parameters can be freely set for precise control

• Offline Prejudgment Support: Allows customization and modification of reports
  

• Non-Damaging Chip Handling: Capable of extracting chips without damaging the protective film, reducing the risk of product damage
  

• Customizable Nozzles: Minimizes the risk of chip pressure marks
  

• Nanometer-Precision Optical Detection Platform: Ensures highly accurate inspection
  

• Customizable Lenses: Supports optional detection for minor cleavage patterns
  

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